To enable faster and more efficient data analysis with enhanced accuracy, CoE-CPPICS is equipped with both semi-automatic and fully automatic probe stations. The semi-automatic probe station can handle 6-inch photonic wafers and perform multi-channel DC probing (up to 16 channels) and RF characterization up to 50 GHz.

CoE-CPPICS leverages advanced automation for efficient data analysis and enhanced accuracy with fully automatic probe stations. These stations can handle 8-inch photonic wafers, enabling fiber array optical studies and supporting multi-channel DC probing (up to 32 channels) along with RF characterization up to 50 GHz across various temperature conditions. The fully automatic probe station is useful for failure analysis studies and industry-standard yield strength assessments.